Atomic Force Microscope(AFM,ISUPAM)

   Atomic Force Microscope (AFM), an analytical instrument that can be used to study the surface structure of solid materials, including insulators. It studies the surface structure and properties of a substance by detecting the extremely weak interatomic interaction between the surface of the sample to be tested and a micro force-sensitive element. AFM uses a flexible cantilever with one end fixed at the other end and a needle tip to detect the surface topography or other surface properties of the sample. When the sample or tip is scanned, the interaction force (suction or repulsion) between the tip and the sample causes the cantilever (Cantilever) deformation. A laser beam is irradiated onto the back of the cantilever, and the cantilever reflects the laser beam onto a photodetector, and the deformation information of the cantilever is converted into a measurable photoelectric signal by the detector, and the laser intensity difference received by the detector in different quadrants is the same as the cantilever .The shape variables form a certain proportional relationship. An image of the surface topography of the sample can be obtained by measuring the change in the scanning position of the sample corresponding to the detected voltage.

(ISUPAM, Institute of Super-microstructure and Ultrafast Process in Advanced Materials)